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Evaluating Single Event Upsets in Deep Neural Networks for Semantic Segmentation: an embedded system perspective

Gutiérrez-Zaballa, Jon, Basterretxea, Koldo, Echanobe, Javier

arXiv.org Artificial Intelligence

As the deployment of artifical intelligence (AI) algorithms at edge devices becomes increasingly prevalent, enhancing the robustness and reliability of autonomous AI-based perception and decision systems is becoming as relevant as precision and performance, especially in applications areas considered safety-critical such as autonomous driving and aerospace. This paper delves into the robustness assessment in embedded Deep Neural Networks (DNNs), particularly focusing on the impact of parameter perturbations produced by single event upsets (SEUs) on convolutional neural networks (CNN) for image semantic segmentation. By scrutinizing the layer-by-layer and bit-by-bit sensitivity of various encoder-decoder models to soft errors, this study thoroughly investigates the vulnerability of segmentation DNNs to SEUs and evaluates the consequences of techniques like model pruning and parameter quantization on the robustness of compressed models aimed at embedded implementations. The findings offer valuable insights into the mechanisms underlying SEU-induced failures that allow for evaluating the robustness of DNNs once trained in advance. Moreover, based on the collected data, we propose a set of practical lightweight error mitigation techniques with no memory or computational cost suitable for resource-constrained deployments. The code used to perform the fault injection (FI) campaign is available at https://github.com/jonGuti13/TensorFI2 , while the code to implement proposed techniques is available at https://github.com/jonGuti13/parameterProtection .


How Good is the Bayes Posterior in Deep Neural Networks Really?

Wenzel, Florian, Roth, Kevin, Veeling, Bastiaan S., Świątkowski, Jakub, Tran, Linh, Mandt, Stephan, Snoek, Jasper, Salimans, Tim, Jenatton, Rodolphe, Nowozin, Sebastian

arXiv.org Machine Learning

During the past five years the Bayesian deep learning community has developed increasingly accurate and efficient approximate inference procedures that allow for Bayesian inference in deep neural networks. However, despite this algorithmic progress and the promise of improved uncertainty quantification and sample efficiency there are---as of early 2020---no publicized deployments of Bayesian neural networks in industrial practice. In this work we cast doubt on the current understanding of Bayes posteriors in popular deep neural networks: we demonstrate through careful MCMC sampling that the posterior predictive induced by the Bayes posterior yields systematically worse predictions compared to simpler methods including point estimates obtained from SGD. Furthermore, we demonstrate that predictive performance is improved significantly through the use of a "cold posterior" that overcounts evidence. Such cold posteriors sharply deviate from the Bayesian paradigm but are commonly used as heuristic in Bayesian deep learning papers. We put forward several hypotheses that could explain cold posteriors and evaluate the hypotheses through experiments. Our work questions the goal of accurate posterior approximations in Bayesian deep learning: If the true Bayes posterior is poor, what is the use of more accurate approximations? Instead, we argue that it is timely to focus on understanding the origin of the improved performance of cold posteriors.